Test and Evaluation of Defense RF Electronic Systems

The course presents an overview of the requirements for testing defense-related RF electronics systems (Radar, EW, Communications, and RF surveillance systems). The course begins with a detailed discussion of test and evaluation as it pertains to DoD and U.S. government systems acquisition processes, covering policy, T&E processes, test planning, and test procedures. The course provides detailed descriptions of laboratory and in-situ testing methods for components, sub-assemblies, assemblies, subsystems, systems, and platform-(ship, air, ground,) level testing.

Managers, engineers and scientists who are involved in the development of defense electronic systems, and who will have to be involved in the testing of the systems, beginning at the component level, and extending through subsystem, and system, to platform level testing should attend this course.

Each student will receive a complete set of handouts matching the material presented by the lecturers, and a CD with all the presentation material.

Course Outline

  1. Introduction
    • Introduction to T&E
    • Testing Requirements
    • Testing Motivation
    • T&E Case Studies
    • DoD T&E Organizations & Agencies
    • Test Plans
    • General Testing Procedures
    • Layered Test Process
    • Calibration & NIST Overview
  2. Laboratory Test Equipment
    • Basic test equipment - VOMs, DVMs, O-scopes
    • Spectrum and Network Analyzers
    • Automated, Computer-Controlled Testing (GPIB, Lab View, etc.)
  3. Testing Components, Board-level, and Subassembly Testing
    • Active (transistors, tubes, Ics) and Passive (resistors, capacitors, etc) Components
    • Circulators, isolators, splitters
    • Connectors and cabling
    • Boards, chassis, and board-level assemblies
  4. Subsystem Testing
    • Receivers
    • Transmitters
    • Antennas
  5. System Testing
    • Radar
    • EW
    • Communications
    • RF surveillance systems
  6. Systems Testing by Platform
    • SeaAirborne
    • Space
    • Ground
  7. Special Topics
    • EW Testing
    • C4ISR
    • M&S in T&E

Instructor

Mr. Duane Tate, Georgia Tech Research Institute senior research engineer, has an extensive 40-year career as a systems engineer on major Department of Defense Systems Acquisitions programs providing design, development, test and evaluation, modeling and simulation, and planned program performance improvement throughout all phases of the acquisition program. His career began during the period of structured, mil-spec, acquisition policies and procedures and spans the waning of Defense Department’s emphasis on systems engineering and formal policies and procedures in the 1990s, to the resurgence of the importance of these formal processes beginning in 1999-2000. Tate’s interests include systems engineering, T&E, advanced distributed systems, and modeling & simulation technologies.

Mr. V. Locke Wilde holds a BA degree from California State University Northridge. He has 28 years of Naval experience aboard ship in the test and evaluation of ship defense systems, followed by 10 years in industry, planning and supporting T&E of Naval systems. While employed as a senior test and evaluation engineer at the Georgia Tech Research Institute (GTRI) he was involved in the land-based test and evaluation of the AN/SPY-3 radar system at Wallops Island, VA and has participated in the planning for ship-based at-sea testing for that system.

Continuing Education Credit

This program meets the criteria for the nationally accepted Continuing Education Unit (CEU). Each participant successfully completing this 4 day course will earn 2.8 CEUs. These CEUs apply to the elective requirements for the TEREC Test & Evaluation Certificate.

Schedule and Fees

This course is currently not scheduled. Persons interested in taking the class may note their interest by clicking here and completing this form. When enough interest is shown, we will schedule the course and contact interested parties.

Course Last Offered

March 31 - April 4, 2008, Atlanta, GA

 

Last Updated April 9, 2008